The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2005

Filed:

Oct. 14, 2002
Applicants:

Daniel A. Tazartes, West Hills, CA (US);

Peter Kyriacou, Sun Valley, CA (US);

Shaw-wen Fann, Woodland Hills, CA (US);

James G. Marsden, West Hills, CA (US);

Inventors:

Daniel A. Tazartes, West Hills, CA (US);

Peter Kyriacou, Sun Valley, CA (US);

Shaw-Wen Fann, Woodland Hills, CA (US);

James G. Marsden, West Hills, CA (US);

Assignee:

Northrop Grumman Corporation, Woodland Hills, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03F001/26 ;
U.S. Cl.
CPC ...
Abstract

A system and method for performing high performance quantizer processing of sensor data in a multiple-channel quantizer system. A reset prioritization scheme is provided for current sources connected to an integrator in the multiple-channel quantizer for preventing saturation of the various quantizer channels. The reset prioritization scheme determines the channels most in need of a reset to prevent saturation based upon predicted quantizer signals to appear on the channels during the next processing cycle of the quantizer system. This method of controlling the reset processing permits significantly higher acceleration capacity by preventing quantizer channel saturation in system utilizing accelerometers. The quantizer processing method further includes an improved calibration scheme for self-calibrating the various channels in a multiple-channel quantizer to account for multiple sources of error, including quantizer bias, asymmetry between applied positive and negative resets, and voltage scale factor of the quantizer channel in calibration.


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