The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Feb. 25, 2000
Thomas C. Terwilliger, Sante Fe, NM (US);
Thomas C. Terwilliger, Sante Fe, NM (US);
The Regents of the University of California, Los Alamos, NM (US);
Abstract
A maximum-likelihood method for improves an electron density map of an experimental crystal structure. A likelihood of a set of structure factors {F} is formed for the experimental crystal structure as (1) the likelihood of having obtained an observed set of structure factors {F} if structure factor set {F} was correct, and (2) the likelihood that an electron density map resulting from {F} is consistent with selected prior knowledge about the experimental crystal structure. The set of structure factors {F} is then adjusted to maximize the likelihood of {F} for the experimental crystal structure. An improved electron density map is constructed with the maximized structure factors.