The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Mar. 08, 2002
Applicants:
Kenneth Scott Kump, Waukesha, WI (US);
Jibril Odogba, Waukesha, WI (US);
Inventors:
Kenneth Scott Kump, Waukesha, WI (US);
Jibril Odogba, Waukesha, WI (US);
Assignee:
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G001/64 ;
U.S. Cl.
CPC ...
Abstract
A method minimizing artifacts in dual or multiple energy images includes: obtaining first and second offset images from a detector after obtaining first and second exposure image data sets from the detector. Other embodiments include: changing the dosage of the exposures, changing the gain of the detector, changing the pixel acquisition resolution of the detector, and leaving the detector unscrubbed between the first and second read times.