The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2005

Filed:

Jan. 20, 2004
Applicants:

Jakob G. Nijboer, Eindhoven, NL;

Jacobus P. J. Heemskerk, Eindhoven, NL;

Inventors:

Jakob G. Nijboer, Eindhoven, NL;

Jacobus P. J. Heemskerk, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B007/00 ;
U.S. Cl.
CPC ...
Abstract

A next generation of high-speed CD-RW discs for high-speed recording (4x-10x) needs a new write strategy, which is not suited for recording at lower speeds (1x-4x). Existing CD-RW recorders may accept these discs and make recordings according to existing write strategies. This will result in unreadable discs. To prevent this, a Power Calibration Area (PCA) and a Program Memory Area (PMA), both needed for recording, are hidden for the existing recorders. As a result the disc will be rejected. In a method wherein an absolute time reference (ATIP) is applied on the disc, the start locations of these areas being determined by a fixed time offset relative to a subsequent Lead-in area, the PCA and PMA are made untraceable by introducing and Absolute Time in Pre-Groove (ATIP) time code jump of, for instance, one minute just before the Start time of the Lead-in area. Alternatively, the absolute Time in Pre-Groove (ATIP) time code jumps are introduced between a Test Area and a Count Area of the program calibration area (PCA).


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