The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Sep. 06, 2002
Arno Simon, Karlsruhe, DE;
Norbert Rapp, Hagenbach, DE;
Arno Simon, Karlsruhe, DE;
Norbert Rapp, Hagenbach, DE;
Bruker Optik GmbH, , DE;
Abstract
A method for taking a spatially resolved spectrum, in particular an infrared (IR) spectrum, of a sample by means of a Fourier-transform (FT)-spectrometer, is described wherein light emitted by a light source is fed to an interferometer, directed onto the sample and detected by an array-detector, wherein a movable reflector of the interferometer is displaced over a distance s and the array-detector is read out at a number n of predetermined discrete way points s, . . . , sof the distance s, respectively. When the movable reflector is displaced over the distance s, the array-detector is first read out at respective non-adjacent way points sseparated by at least one respective intermediate way point s, and that the movable reflector is displaced over the distance s at least twice, wherein the array-detector is read out at the way points supon a second or further repeated displacement over the distance s.