The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Jul. 03, 2002
Shinji Maezono, Osaka, JP;
Satoshi Kanki, Osaka, JP;
Shinji Maezono, Osaka, JP;
Satoshi Kanki, Osaka, JP;
Nippon Sheet Glass Company, Limited, Tokyo, JP;
Abstract
A method for detecting a flaw accompanied with an optical defect if any on or in a sheet-like transparent body which is moved, and determine its type comprises placing an illuminator on one side of a sheet-like transparent body, and placing a (one-dimensional) image pickup on the opposite side. The illuminator means comprises lighting and darkening portions, and the image pickup is placed relative to the illuminator such that the boundary between the portions appears on the image pickup as a straight line in parallel with the long axis of the pickup. Image data created from the image pickup, are subjected to contrast enhancement to provide contrast enhanced image data which are displayed as a contrast enhanced image. The sequence (flaw pattern) of light spots and dark spots appears in the enhanced image as of the sheet-like transparent body is moved, and determines the type of flaw.