The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
May. 12, 2003
Andrew L. Ingles, Jr., Alpharetta, GA (US);
Alice Liu, Alpharetta, GA (US);
William A. Reed, Summit, NJ (US);
Peng Wang, Alpharetta, GA (US);
Ming Yang, Atlanta, GA (US);
Andrew L. Ingles, Jr., Alpharetta, GA (US);
Alice Liu, Alpharetta, GA (US);
William A. Reed, Summit, NJ (US);
Peng Wang, Alpharetta, GA (US);
Ming Yang, Atlanta, GA (US);
Furukawa Electric North America, Norcross, GA (US);
Abstract
A system and technique for determining discontinuities over a span of a multimode optical fiber (MMF). An optical time domain reflectometer (OTDR) has an operating port, and a first end face of a singlemode optical fiber (SMF) is coupled to the operating port. Light pulses produced by the OTDR emerge from a second end face of the SMF, and an alignment stage aligns the second end face with an end face of a multimode optical fiber (MMF) having a core of given radius. The light pulses from the second end face of the SMF are applied at selected radial positions on the MMF core to excite corresponding mode groups in the MMF. Backscatter light produced by each excited mode group is coupled to the OTDR through the SMF. Locations and values of events detected along the MMF are indicated on the OTDR for each selected radial position.