The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Apr. 05, 2004
Applicants:
Joseph D. S. Deng, Taoyuan, TW;
Hong-chyi Lee, Taotuan Hsien, TW;
Inventors:
Joseph D. S. Deng, Taoyuan, TW;
Hong-Chyi Lee, Taotuan Hsien, TW;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/02 ;
U.S. Cl.
CPC ...
Abstract
A flexible probe, applicable for measuring signals from the object with an uneven surface, includes at least a probe tip, a flexible multi-layered dielectric substrate, a planar transmission structure and a coaxial transmission structure. The probe tip is connected to the planar transmission structure and extends beyond the flexible dielectric substrate. The planar transmission structure is attached to and supported by the flexible dielectric substrate and then connected to the coaxial transmission structure.