The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Feb. 27, 2004
Nobuaki Takazawa, Susono, JP;
Ryuji Shimazaki, Mishima, JP;
Nobuaki Takazawa, Susono, JP;
Ryuji Shimazaki, Mishima, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Abstract
A method of production of a scanning probe microscope probe provided with a sharp head made of a single wall carbon nanotube comprising imparting a catalyst metal to a tip of probe body, then irradiating the catalyzed part of the tip of the probe body by an arc discharge caused between needle shaped carbon electrodes in an inert gas atmosphere in a scanning probe microscope so as to grow a single wall carbon nanotube at the catalyzed part, and a method of inspection and method of use of the same.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile