The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Sep. 04, 2002
Gary F. Stone, Livermore, CA (US);
James E. Trebes, Livermore, CA (US);
Gary F. Stone, Livermore, CA (US);
James E. Trebes, Livermore, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
An optic for the imaging optics on the distal end of a flexible fiberoptic endoscope or rigid borescope inspection tool. The image coverage is over a narrow (<20 degrees) field of view with very low optical distortion (<5% pin cushion or barrel distortion), compared to the typical <20% distortion. The optic will permit non-contact surface roughness measurements using optical techniques. This optic will permit simultaneous collection of selected image plane data, which data can then be subsequently optically processed. The image analysis will yield non-contact surface topology data for inspection where access to the surface does not permit a mechanical styles profilometer verification of surface topology. The optic allows a very broad spectral band or range of optical inspection. It is capable of spectroscopic imaging and fluorescence induced imaging when a scanning illumination source is used. The total viewing angle for this optic is 10 degrees for the full field of view of 10 degrees, compared to 40-70 degrees full angle field of view of the conventional gradient index or GRIN's lens systems.