The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2005

Filed:

Jun. 24, 2003
Applicant:

David Hwang, Fort Collins, CO (US);

Inventor:

David Hwang, Fort Collins, CO (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25B001/18 ;
U.S. Cl.
CPC ...
Abstract

A novel two-stage clamp used in testing a device-under-test (DUT) is herein presented. The two-stage clamp provides two sequential actuations via one linear force, and includes clamps moving in multiple different directions. The two-stage clamp uniquely uses the DUT being clamped to provide the linkage and timing for the two-stage actuation of clamps moving in three different directions.


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