The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
May. 24, 2002
Eric D. Carlson, Cupertino, CA (US);
Oleg Kolosov, San Jose, CA (US);
Leonid Matsiev, San Jose, CA (US);
Laura T. Mazzola, Redwood City, CA (US);
Mikhail Spitkovsky, Sunnyvale, CA (US);
John Gallipeo, Morgan Hill, CA (US);
Eric D. Carlson, Cupertino, CA (US);
Oleg Kolosov, San Jose, CA (US);
Leonid Matsiev, San Jose, CA (US);
Laura T. Mazzola, Redwood City, CA (US);
Mikhail Spitkovsky, Sunnyvale, CA (US);
John Gallipeo, Morgan Hill, CA (US);
Symyx Technologies, Inc., Santa Clara, CA (US);
Abstract
A method and apparatus for measurement of mass of small sample sizes. The method and apparatus is particularly adapted for providing microbalance measurement of solid materials as part of a combinatorial research program. The method and apparatus contemplate monitoring the response of a resonator holding a sample and correlating the response with mass change in the samples.