The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2005

Filed:

Sep. 11, 2001
Applicants:

Ya-huey Juan, Poughkeepsie, NY (US);

Jhy-chun Wang, Poughkeepsie, NY (US);

Inventors:

Ya-Huey Juan, Poughkeepsie, NY (US);

Jhy-Chun Wang, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F009/44 ;
U.S. Cl.
CPC ...
Abstract

A time-interval based monitor tool is provided for monitoring performance of a running application. The tool includes a time-based monitor function which is dynamically insertable into and removable from an address space of a running application to be monitored transparent to the application and without requiring recompilation. The time-based monitor function allows an operator to reset the monitor time interval without requiring extraction of the monitor function. In addition, the time-based monitor function allows access to one or more global variables of the application, and by changing a global variable can effect a change in the application's operation path.


Find Patent Forward Citations

Juan, Ya-Huey. (2005). Time-interval based monitor function for dynamic insertion into and removal from a running application (U.S. Patent No. 6928639). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6928639

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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