The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2005
Filed:
Jun. 18, 2003
Jacek A. Czerwonka, Redmond, WA (US);
Jacek A. Czerwonka, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Provided is a system and method for black-box testing of software using positive and negative test cases with N-way combinations of parameter values. An original model comprising valid and invalid values is modified in a first phase, by generating exclusions (constraints) for pairs of invalid values. A first suite of test cases is generated from the modified model, and positive test cases eliminated, creating a first test suite with only negative tests. In a second phase, the original model is modified by eliminating invalid values, from which a second test suite having only positive test cases for all valid N-way combinations is generated. Merging the two test suites provides a suite of positive and negative test cases that test software with N-way combinations of values, in which each negative test case has only one invalid value.