The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2005
Filed:
Jun. 21, 2002
Kazuo Onishi, Fujinomiya, JP;
Hiroyuki Nishida, Fujinomiya, JP;
Kazuo Onishi, Fujinomiya, JP;
Hiroyuki Nishida, Fujinomiya, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
When a film is rewound, light is applied from light-emitting units to the film, and light that has passed through the film is detected by light-detecting units to detect a plurality of inclined defects in the film based on a change in the intensity of the light transmitted through the film. Slits oriented in the direction of the inclined defects are disposed in front of the light-emitting units and the light-detecting units. Detected signals outputted from the light-detecting units are transmitted to a processing device and processed thereby. The processing device processes the signals by approximating a maximum value array of extremal values of the signals in respective reference lengths of the film, with two functions in zones, and identifying a boundary between the zones as a position where a defect disappears.