The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2005
Filed:
Jan. 17, 2002
Applicants:
Hegeon Kwun, San Antonio, TX (US);
Sang-young Kim, San Antonio, TX (US);
Inventors:
Hegeon Kwun, San Antonio, TX (US);
Sang-Young Kim, San Antonio, TX (US);
Assignee:
Southwest Research Institute, San Antonio, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N029/10 ;
U.S. Cl.
CPC ...
Abstract
A method of analysis long range guided wave data reflected from defects and geometric features such as welds in a structure. The method involves acquiring two sets of data, and time shifting one set of data relative to the other. Data points that match in time after the shifting are considered to represent defects or geometric features in the structure. The result of the method is exclusion of false signal data and automation of data analysis.