The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Mar. 14, 2003
Randolph C. Brost, Albuquerque, NM (US);
David R. Strip, Albuquerque, NM (US);
Randall H. Wilson, Albuquerque, NM (US);
Randolph C. Brost, Albuquerque, NM (US);
David R. Strip, Albuquerque, NM (US);
Randall H. Wilson, Albuquerque, NM (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
An apparatus and method of measuring an article is provided. The method includes providing an article having a feature to be measured, the article having a surface; measuring the surface of the article with a measuring instrument to obtain article surface data; and analyzing the article surface feature data such that data on the feature to be measured is developed. Measuring the surface of the article can include scanning the measuring instrument over the article surface. Analyzing the article surface feature data can include associating portions of the article surface data with individual features thereby producing associated feature surface data; and analyzing the associated feature surface data. The measuring instrument can be, for example, a contact measuring instrument or an interference measuring instrument. A computer storage medium having instructions stored therein for causing a computer to perform the method described above is also provided.