The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Nov. 14, 2000
Amadeo J. Pesce, Cincinnati, OH (US);
Marios M. Polycarpou, Cincinnati, OH (US);
Zhong Wang, Cincinnati, OH (US);
Goce Dimeski, Queensland, AU;
Peter Hickman, Queensland, AU;
Amadeo J. Pesce, Cincinnati, OH (US);
Marios M. Polycarpou, Cincinnati, OH (US);
Zhong Wang, Cincinnati, OH (US);
Goce Dimeski, Queensland, AU;
Peter Hickman, Queensland, AU;
University of Cincinnati, Cincinnati, OH (US);
The State of Queensland, Brisbane, AU;
Abstract
A method and apparatus for examining data from a chemical analyzer for artifactual results. A set of rules are established to identify artifactual results based upon experience with the analyzer. Moreover, each rule can be associated with a sample collection or testing problem which potentially caused the artifactual result. Using these rules, output data from the analyzer can be tested to see if any of the rules are satisfied. If a rule is satisfied, then an artifactual result can be indicated, as well as the potential cause of the artifactual result. An output file can be created which indicates the artifactual data samples and the potential artifactual causes. Preferably, the rules are provided in a user-modifiable data file, so that the rules may be modified based upon additional experience.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile