The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Jun. 10, 2004
Hiroshi Kamimura, Hitachi, JP;
Shigeru Izumi, Tokyo, JP;
Hiroshi Kitaguchi, Nakamachi, JP;
Atsushi Yamagoshi, Hitachi, JP;
Katsutoshi Satoh, Hitachi, JP;
Noriyuki Sadaoka, Tokai, JP;
Tarou Takagi, Hitachi, JP;
Kouji Kuwabara, Hitachi, JP;
Shouhei Numata, Hitachi, JP;
Hiroshi Kamimura, Hitachi, JP;
Shigeru Izumi, Tokyo, JP;
Hiroshi Kitaguchi, Nakamachi, JP;
Atsushi Yamagoshi, Hitachi, JP;
Katsutoshi Satoh, Hitachi, JP;
Noriyuki Sadaoka, Tokai, JP;
Tarou Takagi, Hitachi, JP;
Kouji Kuwabara, Hitachi, JP;
Shouhei Numata, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.