The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2005

Filed:

Aug. 29, 2003
Applicants:

Hemant Melkote, San Jose, CA (US);

Robert J. Mcnab, San Jose, CA (US);

David D. Nguyen, Fountain Valley, CA (US);

John Yin Kwong LI, Laguna Niguel, CA (US);

Inventors:

Hemant Melkote, San Jose, CA (US);

Robert J. McNab, San Jose, CA (US);

David D. Nguyen, Fountain Valley, CA (US);

John Yin Kwong Li, Laguna Niguel, CA (US);

Assignee:

Western Digital Technologies, Inc., Lake Forest, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B005/596 ;
U.S. Cl.
CPC ...
Abstract

A method for reducing an estimation period for repeatable runout (RRO) errors in a disk drive comprising a head, a disk surface having a track partitioned by servo-wedges, and a servo control system for controlling the movement of the head relative to a track during revolutions of the disk. The method includes estimating the RRO errors of the track based on a) a series of position error signal values obtained during a current revolution of the disk surface, and b) a previous estimation of the RRO errors of the track obtained during a previous revolution of the disk surface and determining a differential value between a first measure of the estimated RRO errors and a second measure of the previous estimation of RRO errors, and repeating the estimating and determining for subsequent revolutions of the disk surface until the determined differential value is smaller than a pre-selected threshold value.


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