The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
May. 12, 2003
Rudolf Oldenbourg, Falmouth, MA (US);
Mykhailo Shribak, Woods Hole, MA (US);
Clifford C. Hoyt, Wellesley, MA (US);
Peter Török, London, GB;
Rudolf Oldenbourg, Falmouth, MA (US);
Mykhailo Shribak, Woods Hole, MA (US);
Clifford C. Hoyt, Wellesley, MA (US);
Peter Török, London, GB;
Marine Biological Laboratory, Woods Hole, MA (US);
Abstract
A microscope system for determining optical properties of a specimen includes a source of polarized light, a detector for detecting the intensity of light incident thereon, an optical path extending from the source to the detector, a condenser for providing light from the source to the specimen, an objective for receiving light from the specimen, a support for mounting the specimen, a sectored variable retarder mounted in the optical path, and a polarized light analyzer mounted in the path between the sectored variable retarder and the detector. The variable retarder has a multiple sectors. Each sector is individually addressable by a control signal that affects the light retardation characteristics of the sector.