The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Nov. 28, 2001
Applicants:
Hans Steinbichler, Neubeuern, DE;
Volker Rasenberger, Raubling, DE;
Rainer Huber, Piding, DE;
Roman Berger, Schnaitsee, DE;
Inventors:
Hans Steinbichler, Neubeuern, DE;
Volker Rasenberger, Raubling, DE;
Rainer Huber, Piding, DE;
Roman Berger, Schnaitsee, DE;
Assignee:
Steinbichler Optotechnik GmbH, Neubeurn, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B009/02 ;
U.S. Cl.
CPC ...
Abstract
A process serves to record the deformation of objects (). In order to facilitate reliable evaluation even in the case of relatively large deformations, during the deformation of the object () a sequence or series of images of the object is recorded with a measuring process. The differential between two sequential images is formed. These differentials are integrated (FIG.).