The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Dec. 20, 2000
Applicants:
Shigeru Eiho, Uji, JP;
Kuraji Nitta, Wakayama, JP;
Shoichi Dedachi, Wakayama, JP;
Inventors:
Assignee:
Noritsu Koki Co., Ltd., Wakayama, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N005/208 ;
U.S. Cl.
CPC ...
Abstract
In a sharpening process of image data using a Laplacian operation, a parameter k for controlling the size of a Laplacian to be subtracted from an original image, a parameter θ for suppressing influences of noise and a parameter λ for suppressing an overshoot and an undershoot are respectively provided, and these parameters are altered in accordance with the state of an original image. Thus, it becomes possible to carry out the sharpening process on the image data without causing emphasized noise and occurrences of an overshoot and an undershoot.