The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2005

Filed:

Dec. 11, 2003
Applicant:

Katsutoshi Seki, Tokyo, JP;

Inventor:

Katsutoshi Seki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M013/00 ;
U.S. Cl.
CPC ...
Abstract

A first stage inner code decoder performs a first error correction process for a plurality of inner code words. A first stage outer code decoder performs a second error correction process for a plurality of outer code words. A second stage inner code decoder performs a third error correction process for one or more inner code words whose number of errors has been decreased by the second error correction process and skips the third error correction process for one or more inner code words whose number of errors has not been decreased by the second error correcting process.


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Seki, Katsutoshi. (2005). Iterative decoding method and iterative decoding apparatus (U.S. Patent No. 6924754). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6924754

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