The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2005

Filed:

Sep. 17, 2002
Applicants:

Yoshinori Kato, Kanagawa, JP;

Takaaki Kosuge, Kanagawa, JP;

Inventors:

Yoshinori Kato, Kanagawa, JP;

Takaaki Kosuge, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J001/04 ;
U.S. Cl.
CPC ...
Abstract

A technique is provided in which the inside and outside of an exposure device is prevented from being adversely affected by leakage of light by setting an inspection output most suitable for high-power LD. A light-leakage detection level is set correspondingly to output characteristics of each high-power LD, and respective thresholds thereof are previously stored. As a result, leakage of light can be determined in a lower-power state of 100 mW or less. Accordingly, even if leakage of light may occur, leakage of light can be determined before high-power light leaks, and the inside and outside of the device can be prevented from being adversely affected by light leakage.


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