The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Apr. 26, 2002
Applicants:
Gunther Coen, Dusseldorf, DE;
Ernst Lunh, Haan, DE;
Dietmar Oberhoff, Leichlingen, DE;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B017/02 ;
U.S. Cl.
CPC ...
Abstract
The invention relates to a method for non-destructive testing of materials, in which at least two differently guided waves (modes) are produced in the solid body, each at at least one specified angle, the measured reflection values are placed in relation to a reference echo in order to obtain a relative reflection value, and the relative reflection values of the individual modes are again placed in relation to one another, thereby enabling the size and type of the defects to be determined.