The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2005

Filed:

Jul. 07, 2003
Applicants:

Franz Szenger, Königsbronn, DE;

Walter Jenisch, Heidenheim, DE;

Hans-jörg Furtwängler, Aalen, DE;

Kurt Brenner, Satteldorf, DE;

Thomas Maier, Essingen, DE;

Horst Stacklies, Aalen, DE;

Inventors:

Franz Szenger, Königsbronn, DE;

Walter Jenisch, Heidenheim, DE;

Hans-Jörg Furtwängler, Aalen, DE;

Kurt Brenner, Satteldorf, DE;

Thomas Maier, Essingen, DE;

Horst Stacklies, Aalen, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B005/00 ;
U.S. Cl.
CPC ...
Abstract

The invention is directed to a probe for coordinate measuring apparatus. The apparatus includes measuring systems () for measuring the deviation of the flexible part () of the probe and a damping device damps the flexible part () of the probe. The damping device is embodied as at least one friction brake () and the friction force of the friction brake is adjustable. The flexible part () of the probe can also be blocked by the friction brake ().


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