The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2005

Filed:

Feb. 01, 2002
Applicants:

John L. Loya, Rancho Santa Magarita, CA (US);

Jeff M. Duke, Huntington Beach, CA (US);

David M. Kailiponi, Cypress, CA (US);

Inventors:

John L. Loya, Rancho Santa Magarita, CA (US);

Jeff M. Duke, Huntington Beach, CA (US);

David M. Kailiponi, Cypress, CA (US);

Assignee:

UGS Corp., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F017/30 ;
U.S. Cl.
CPC ...
Abstract

A system and method for creating a datum reference frame includes selecting a first datum, wherein the first datum comprises a plurality of faces. A first definition for the selected first datum is determined. One or more second datums, based on the determined first definition, are automatically determined, wherein the second datum comprises a plurality of faces. The second datum is selected. A second definition for the selected second datum is determined. One or more third datums based on the determined second definition, wherein the third datum comprises a plurality of faces, are automatically determined. The third datum is selected.


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