The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2005

Filed:

May. 27, 2004
Applicants:

Naohiro Takakamo, Shibata, JP;

Kuniyoshi Sakai, Niigata, JP;

Yoshikazu Terakami, Yachiyo, JP;

Inventors:

Naohiro Takakamo, Shibata, JP;

Kuniyoshi Sakai, Niigata, JP;

Yoshikazu Terakami, Yachiyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/00 ; G01R031/02 ;
U.S. Cl.
CPC ...
Abstract

A method for measuring the resistance component current included in the leakage current is provided. In a monitoring apparatus and system for measurement the signal waveform of at least one AC cycle is sampled. The resistance component leakage current is measured by dividing the average of integrated value of the instantaneous leakage current values and the instantaneous voltage values by the square root of average of squared instantaneous voltage values. In addition, a voltage signal of the target measurement circuit is obtained the waveform of the leakage current signal and the voltage signal for one cycle is sampled and stored; the leakage current signal and the voltage signal are expanded to N-th higher harmonic wave component respectively, and the resistance component that relates to the leakage current is calculated.


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