The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2005
Filed:
Jul. 31, 2002
Kishore Acharya, Brookfield, WI (US);
Priya Gopinath, Waukesha, WI (US);
Jianying LI, New Berlin, WI (US);
Darin Okerlund, Muskego, WI (US);
Matthew Joseph Walker, New Berlin, WI (US);
Kishore Acharya, Brookfield, WI (US);
Priya Gopinath, Waukesha, WI (US);
Jianying Li, New Berlin, WI (US);
Darin Okerlund, Muskego, WI (US);
Matthew Joseph Walker, New Berlin, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A method for plaque characterization. The method comprises obtaining a first set of image data created in response to a first x-ray energy level and including a plurality of pixel elements. Each of the first pixel elements corresponds to a unique location in an object being scanned. The method further comprises obtaining a second set of image data created in response to a second x-ray energy level and including a plurality of second pixel elements. Each of the second pixel elements corresponds to one of the first pixel elements and the second x-ray energy level is higher than the first x-ray energy level. The method also comprises calculating a third set of image data in response to the first set of image data and the second set of image data. The calculating includes subtracting each second pixel element from the corresponding first pixel element.