The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2005

Filed:

Sep. 16, 2003
Applicants:

Koji Kise, Hyogo, JP;

Hiroshi Watanabe, Hyogo, JP;

Inventors:

Koji Kise, Hyogo, JP;

Hiroshi Watanabe, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K005/00 ;
U.S. Cl.
CPC ...
Abstract

A resist is on a substrate with a lower layer film between the resist and the substrate. The lower layer film includes chemical elements and the element absorbing the largest amount of x-rays is carbon. The thickness of the lower layer film is determined by considering the influences of secondary electrons from the substrate and the carbon of the lower layer film. The resist includes chlorine, or a similar element, having a specific absorption edge. Under such conditions, the average wavelength of x-rays absorbed in the resist is in a prescribed range. In this way, in x-ray exposure, blur caused by secondary electrons is suppressed using a wavelength region of relatively shorter wavelengths.


Find Patent Forward Citations

Kise, Koji. (2005). X-ray exposure method (U.S. Patent No. 6922458). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6922458

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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