The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2005
Filed:
Aug. 28, 2002
Adolf Friedrich Fercher, Vienna, AT;
Adolf Friedrich Fercher, Vienna, AT;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
The invention is directed to the detection and imaging of the internal geometry of the eye, particularly of the important components for imaging in the eye such as the cornea, lens, vitreous body and retinal surface, by multichannel short coherence interferometry. A method and arrangement for obtaining topograms and tomograms of the eye structure by many simultaneously recorded interferometric depth scans through transversely adjacent points in the pupil using spatially coherent or spatially partially coherent light sources. The depth scan is carried out by changing the optical length of the interferometer measurement arm by means of a retroreflector. By continuously displacing the retroreflector, the z-position of the light-reemitting point in the eye can be determined by means of the occurring interference. It is possible to record depth scans simultaneously through the use of spatially coherent or spatially partially coherent light beams comprising a plurality of partial beams.