The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2005
Filed:
Sep. 24, 2002
Stephen W. Farnsworth, Loveland, CO (US);
Stephen W. Farnsworth, Loveland, CO (US);
Infineon Technologies North America Corp., Cary, NC (US);
Abstract
A test system for positioning and measuring the far-field pattern of a laser diode under test (LDUT) using a single objective lens and two relay lenses. Positioning is achieved by passing light from the LDUT through a video microscope formed by the objective lens and a first relay lens, which focuses the light onto an image plane for capture by a first camera. Far-field pattern measurement is performed by reflecting a portion of the focused light through a second relay lens, which collimates the light and directs the unfocused light onto an infinity image plane, where it is captured by a second video camera. Angular orientation is achieved using a laser collimator that reflects beam energy from a datum plane of the LDUT. The reflected beam energy forms a point image at the infinity image plane that is used to determine and/or adjust the angular orientation of the LDUT.