The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2005

Filed:

Jul. 16, 2002
Applicant:

Mutsuo Hidaka, Tokyo, JP;

Inventor:

Mutsuo Hidaka, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R027/08 ; G01R013/34 ;
U.S. Cl.
CPC ...
Abstract

In a sampler for use in measuring a waveform of an electric signal, a measurement target current is given as the electric signal to a sampler chipand is also used to produce a trigger current Itr for determining measurement timing on the sampler chip. A comparatorcompares a sum of a feedback current, a current derived from the measurement target current, and the trigger current Itr with a threshold value to produce an SFQ pulse when the sum exceeds the threshold value. The SFQ pulse produced by the comparator is observed or counted for a predetermined duration to measure the waveform of the electric signal.


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