The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2005
Filed:
Jul. 25, 2002
Applicant:
David G. Wang, San Diego, CA (US);
Inventor:
David G. Wang, San Diego, CA (US);
Assignee:
NCR Corporation, Dayton, OH (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F001/00 ;
U.S. Cl.
CPC ...
Abstract
A test apparatus includes a plurality of sensors placed proximate an airflow generator (e.g. a fan) to measure flow rates in respective sub-regions. The test apparatus also includes a controller (e.g., test software) to calculate an operating point of the airflow generator based on flow rate data from the sensors and to determine if the operating print falls within a predefined operating range of the airflow generator. Based on this determination, the controller is able to indicate if the airflow generator is appropriate for use in a given system chassis.