The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2005

Filed:

Apr. 08, 2002
Applicants:

Ulrich Stern, Palo Alto, CA (US);

Joseph I. Chamdani, Santa Clara, CA (US);

Yu Fang, Sunnyvale, CA (US);

Liuxi Yang, Sunnyvale, CA (US);

Inventors:

Ulrich Stern, Palo Alto, CA (US);

Joseph I. Chamdani, Santa Clara, CA (US);

Yu Fang, Sunnyvale, CA (US);

Liuxi Yang, Sunnyvale, CA (US);

Assignee:

Sanera Systems Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M013/00 ;
U.S. Cl.
CPC ...
Abstract

Generating a check matrix includes defining a generator function operable to yield check bits associated with a word. A set of primitive elements is calculated from the generator function. A set of check matrix columns is generated, where each check matrix column includes a matrix having a subset of the set of primitive elements. A check matrix is generated from a subset of the set of check matrix columns, where the check matrix yields a syndrome that comprises an error pattern for the word. The check matrix is reported.


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