The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Jul. 31, 2002
Thomas Hans Rinderknecht, Tualatin, OR (US);
Randy Klingenberg, Beaverton, OR (US);
Nagesh Tamarapalli, Wilsonville, OR (US);
Thomas Hans Rinderknecht, Tualatin, OR (US);
Randy Klingenberg, Beaverton, OR (US);
Nagesh Tamarapalli, Wilsonville, OR (US);
Other;
Abstract
A built-in-self-test (BIST) circuit is discussed for selecting tristate nets with substantially uniform distribution using a tristate testing control device (TTCD). The circuit allows the deterministic testing of tristate nets in the context of pseudo-random BIST. A feedback shift register is described that activates a single tristate or set of tristate at a time in order to avoid bus contention. Another TTCD embodiment uses a counter and decoder. A test mode switching unit (TMSU) coupled between the TTCD and the tristate net selects test or functional mode for tristate enables. Parallel multiplexers are discussed as one embodiment of a TMSU. Another TMSU embodiment describes even better test coverage. A method, which may be performed on a distributed computer system, is discussed for identifying tristate nets within a net-list and adding a TTCD and a TMSU to the net-list.