The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Feb. 08, 2002
Shigeo Kittaka, Osaka, JP;
Minoru Taniyama, Osaka, JP;
Shigeo Kittaka, Osaka, JP;
Minoru Taniyama, Osaka, JP;
Nippon Sheet Glass Co., Ltd., Osaka, JP;
Abstract
A method of measuring a radial index distribution of a rod lens has the steps: (1) the rod lens is processed so that the length is approximately P/2 (where P is pitch length) or an integer multiple thereof and so end surfaces parallel, (2) a patterned surface is set as an object surface in the proximity of one end surface, and an image surface is formed in the proximity of the other end surface by irradiating the patterned surface with condensed monochromatic light, (3) the positions of paraxial focal points and the curves of curvature of field are obtained by observing the image surface, and (4) higher-order index distribution coefficients are calculated back by a fitting process on the basis of the positions of paraxial focal points and the curves of curvature of field.