The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Nov. 09, 2004
Edward R. Beadle, Melbourne, FL (US);
Paul D. Anderson, Melbourne, FL (US);
Steve Richter, Melbourne Beach, FL (US);
John F. Dishman, Melbourne, FL (US);
Emile Ganthier, Palm Bay, FL (US);
Edward R. Beadle, Melbourne, FL (US);
Paul D. Anderson, Melbourne, FL (US);
Steve Richter, Melbourne Beach, FL (US);
John F. Dishman, Melbourne, FL (US);
Emile Ganthier, Palm Bay, FL (US);
Harris Corporation, Melbourne, FL (US);
Abstract
A synthetic aperture radar (SAR) compensates for ionospheric distortions based upon measurement of the group delay, particularly when operating in the VHF/UHF band. The SAR is based upon a multi-input multi-output (MIMO) technique for estimating the effective ionospheric conditions, which is referred to as the group delay approach. The group delay approach is divided into a 1-dimensional (range) approach and a 2-dimensional (range and cross-range) approach. The group delay measures the effective or observed TEC, which is used to reduce the ionospheric distortion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile