The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Oct. 09, 2003
Applicants:
Elisabeth C. Angelos, Hartland, WI (US);
Kevin Franklin King, New Berlin, WI (US);
Cynthia Faye Maier, Milwaukee, WI (US);
Inventors:
Elisabeth C. Angelos, Hartland, WI (US);
Kevin Franklin King, New Berlin, WI (US);
Cynthia Faye Maier, Milwaukee, WI (US);
Assignee:
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V003/00 ;
U.S. Cl.
CPC ...
Abstract
An imaging method for an MRI system includes identifying a low signal region within a scanning volume. An overlap calculation of the scanning volume is generated. The low signal region is substantially eliminated from the overlap calculation thereby generating an adjusted overlap structure. A SENSE calculation is generated in response to the adjusted overlap structure.