The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Aug. 31, 2000
Theodore E. Cadell, Conestogo, CA;
Theodore E. Cadell, Conestogo, CA;
NIR Diagnostics Inc., Ontario, CA;
Abstract
The present invention provides a method of calibrating a spectroscopic device for providing a non-invasive measurement of an analyte level in a sample. The method comprises the steps of: (a) providing a plurality of calibration algorithms; (b) taking a set of non-invasive measurements on said sample with said spectroscopic device; (c) calculating a predicted set of analyte levels for each of the calibration algorithms in response to the set of non-invasive measurements, each of the predicted sets of analyte levels being characterized by a variability range, a slope, an R2(a square of the correlation between said set of non-invasive measurements and said predicted set of analyte levels), and a standard error of prediction; and (d) selecting an appropriate calibration algorithm by using a suitability score based on the variability range, the slope, the Ran the standard error of prediction for each of the predicted sets of analyte levels. A method of generating suitable calibration algorithms in step (a) is also provided.