The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2005

Filed:

Feb. 09, 2004
Applicants:

Chih-kung Lee, Taipei, TW;

Liang-bin Yu, Shinjuang, TW;

Chyan-chyi Wu, Taipei, TW;

Shu-sheng Lee, Taipei, TW;

Wen-jong Wu, Junghe, TW;

Ming-hua Wen, Taipei, TW;

Shih-jui Chen, Taipei, TW;

Giin-yuan Wu, Taipei, TW;

Inventors:

Chih-Kung Lee, Taipei, TW;

Liang-Bin Yu, Shinjuang, TW;

Chyan-Chyi Wu, Taipei, TW;

Shu-Sheng Lee, Taipei, TW;

Wen-Jong Wu, Junghe, TW;

Ming-Hua Wen, Taipei, TW;

Shih-Jui Chen, Taipei, TW;

Giin-Yuan Wu, Taipei, TW;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J003/14 ; H01J040/14 ; H01J005/16 ;
U.S. Cl.
CPC ...
Abstract

A diffraction laser encoder apparatus for positional and movement information measurement of a target made with a diffraction grating. The diffraction laser encoder has a laser light source for generating a source beam. A polarization beam splitter assembly comprises a polarization beam splitter for receiving the source beam for splitting a P-polarization component and an S-polarization component of the source beam into parallel and offset beams. A focusing lens focuses the P-polarization component and the S-polarization component beams onto the target diffraction grating and returning diffracted P-polarization and diffracted S-polarization beams back into the polarization beam splitter for generating a detector beam coaxially containing the diffracted P-polarization and the diffracted S-polarization beams. A detector assembly receives the detector beam for electrical processing and analysis for resolving the positional and movement information. In the process, phase information contained in the diffraction signal returned by the target is analyzed.


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