The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Dec. 08, 2003
Applicants:
Takeo Tanaami, Musashino, JP;
Yumiko Sugiyama, Musashino, JP;
Inventors:
Takeo Tanaami, Musashino, JP;
Yumiko Sugiyama, Musashino, JP;
Assignee:
Yokogawa Electric Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
C12M001/36 ;
U.S. Cl.
CPC ...
Abstract
When a plurality of types of biopolymers on a biochip is to be measured using a fluorescence or colorimetric means, the image of the above biochip is obtained by measuring a plurality of images while moving the above biochip step-wise by an integer multiple of the field-of-view of a one-dimensional or two-dimensional array detector on the sample, then by combining the above-described plurality of images.
Tanaami, Takeo. (2005). Biochip measuring method and measuring equipment (U.S. Patent No. 6919201). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6919201
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile