The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2005

Filed:

Apr. 29, 2003
Applicants:

Alex Breytman, Bellmore, NY (US);

Mark Krichever, Hauppauge, NY (US);

Brad Carlson, Huntington, NY (US);

Tsi David Shi, Stony Brook, NY (US);

Dmitriy Yavid, Stony Brook, NY (US);

Inventors:

Alex Breytman, Bellmore, NY (US);

Mark Krichever, Hauppauge, NY (US);

Brad Carlson, Huntington, NY (US);

Tsi David Shi, Stony Brook, NY (US);

Dmitriy Yavid, Stony Brook, NY (US);

Assignee:

Symbol Technologies, Inc., Holtsville, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K007/10 ;
U.S. Cl.
CPC ...
Abstract

An image scanning device is provided which includes a system for determining the distance to a target to be scanned. The image scanning device includes an optical system and an image sensor array for focusing a light beam and imaging the target. The device preferably includes an automatic focusing system for adjusting the position of the optical system in order to adjust the focal point, and thereby focus the image of the target onto the image sensor array. In one embodiment of the image scanning device, the distance is determined by analyzing a collimated aiming pattern formed by collimating the light beam. In another embodiment, the distance is determined by analyzing a speckle pattern caused by the speckle effect upon the light beam hitting the target.


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