The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Dec. 03, 2003
Yusaku Fujii, Kiryu, JP;
Takao Yamaguchi, Nitta-gun, JP;
Yusaku Fujii, Kiryu, JP;
Takao Yamaguchi, Nitta-gun, JP;
Gunma University, Maebashi, JP;
Abstract
The present invention aims to achieve accurate measurement and evaluation of mechanical properties of an object to be measured 1 without use of a force sensor. A weightis attached to the object to be measured 1 to form a mass-spring system in which the object to be measured 1 serves as a spring element. Then vibration is applied to the mass-spring system to measure the inertial force acting on the weightand the displacement of the weightso that the mechanical properties of the object to be measured 1 will be evaluated based on the inertial force and displacement. A light wave interferometermeasures the displacement velocity of the weightto calculate the inertial force from the acceleration determined by differentiating measured values of the displacement velocity of the weightand calculate the displacement of the weightby integrating the measured values of the displacement velocity of the weight
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile