The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2005

Filed:

Feb. 28, 2001
Applicants:

Johannes B. Steffens, Redondo Beach, CA (US);

Hartwig Adam, Santa Monica, CA (US);

Hartmut Neven, Santa Monica, CA (US);

Inventors:

Johannes B. Steffens, Redondo Beach, CA (US);

Hartwig Adam, Santa Monica, CA (US);

Hartmut Neven, Santa Monica, CA (US);

Assignee:

Nevengineering, Inc., Santa Monica, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/62 ;
U.S. Cl.
CPC ...
Abstract

The present invention may be embodied in a method, and in a related apparatus, for classifying a feature in an image frame. In the method, an original image frame having an array of pixels is transformed using Gabor-wavelet transformations to generate a transformed image frame. Each pixel of the transformed image is associated with a respective pixel of the original image frame and is represented by a predetermined number of wavelet component values. A pixel of the transformed image frame associated with the feature is selected for analysis. A neural network is provided that has an output and a predetermined number of inputs. Each input of the neural network is associated with a respective wavelet component value of the selected pixel. The neural network classifies the local feature based on the wavelet component values, and indicates a class of the feature at an output of the neural network.


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