The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Jun. 16, 2003
Katsuyuki Taguchi, Buffalo Grove, IL (US);
Be-shan Su Chiang, Buffalo Grove, IL (US);
Katsuyuki Taguchi, Buffalo Grove, IL (US);
Be-Shan Su Chiang, Buffalo Grove, IL (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A method for obtaining data from CT scans, including obtaining projection data from at least one detector row in a CT system; applying a weighting function including cone-angle dependent weight to projection data; filtering weighted data; and backprojecting weighted data while accounting for cone-angle. The method finds application to an X-ray CT apparatus, including a helical scanning device configured to collect projection data while at least one of a gantry and a couch moves along an axial direction, the helical scanning device including an X-ray source to generate X-rays, and a detector having detector elements arranged in rows along the axial direction to produce projection data; and a processor, which includes a weighting device to apply a weighting function including cone-angle dependent weight to projection data, thereby obtaining weighted data, a filtering device to filter weighted data, and a backprojecting device to backproject weighted data while accounting for cone-angle.