The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Mar. 25, 2003
Makoto Fujishima, Yamatokoriyama, JP;
Masao Kanamoto, Yamatokoriyama, JP;
Makoto Fujishima, Yamatokoriyama, JP;
Masao Kanamoto, Yamatokoriyama, JP;
Mori Seiki Co., Ltd., Yamatokoriyama, JP;
Intelligent Manufacturing Systems International, Sacramento, CA (US);
Abstract
An accuracy analyzing apparatuscomprises: a light projectorattached to a main spindlefor emitting a light beam having a light axis coaxial with the axis of the main spindle; a semitransparent mirrorwhich transmits part of the emitted light beam and reflects other part; a first imaging devicefor receiving the transmitted light beam; a second imaging devicefor receiving the reflected light beam; and an analyzerwhich calculates light receiving positions in the first and second imaging devicesand, which estimates the light receiving position where the reflected light beam is to be received by the second imaging devicein the case where it is assumed that the axis of the main spindlecoincides with the first axis, and which compares the estimated light receiving position with the calculated light receiving position to analyze the perpendicularity of the axis of the main spindle