The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Feb. 01, 2001
Shinichiro Aizaki, Ome, JP;
Mitsuhiko Saito, Hachioji, JP;
Jitsunari Kojima, Hachioji, JP;
Hitoshi Ueda, Hachioji, JP;
Hideyuki Masuyama, Hachioji, JP;
Shinichiro Aizaki, Ome, JP;
Mitsuhiko Saito, Hachioji, JP;
Jitsunari Kojima, Hachioji, JP;
Hitoshi Ueda, Hachioji, JP;
Hideyuki Masuyama, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope system provided by the present invention in which an electronic camera is used to pick up an observation image by a microscope, comprising a controlling section for setting an image pickup operation of an image pickup element in the electronic camera to an optimum state in accordance with a state of at least one of an optical system combination for a projection magnification of at least an objective lens and a photo eyepiece on a microscope side, an observation method, and lighting conditions.