The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2005

Filed:

Sep. 30, 2002
Applicants:

Clarence E. Thomas, Knoxville, TN (US);

Larry R. Baylor, Farragut, TN (US);

Edgar Voelkl, Oak Ridge, TN (US);

Michael L. Simpson, Knoxville, TN (US);

Michael J. Paulus, Knoxville, TN (US);

Douglas Lowndes, Knoxville, TN (US);

John Whealton, Oak Ridge, TN (US);

John C. Whitson, Clinton, TN (US);

John B. Wilgen, Oak Ridge, TN (US);

Inventors:

Clarence E. Thomas, Knoxville, TN (US);

Larry R. Baylor, Farragut, TN (US);

Edgar Voelkl, Oak Ridge, TN (US);

Michael L. Simpson, Knoxville, TN (US);

Michael J. Paulus, Knoxville, TN (US);

Douglas Lowndes, Knoxville, TN (US);

John Whealton, Oak Ridge, TN (US);

John C. Whitson, Clinton, TN (US);

John B. Wilgen, Oak Ridge, TN (US);

Assignee:

UT-Battelle LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J037/073 ; H01J037/28 ; H01J037/302 ;
U.S. Cl.
CPC ...
Abstract

Systems and method are described for addressable field emission array (AFEA) chips. A plurality of individually addressable cathodes are integrated with an electrostatic focusing stack and/or a plurality of detectors on the addressable field emission array. The systems and methods provide advantages including the avoidance of space-charge blow-up.


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